ATOMIC FORCE MICROSCOPE AFM Read more
ATOMIC FORCE MICROSCOPE AFMThe atomic force microscope allows to measure the topography of various materials down to atomic resolution.
SCANNING TUNNELING MICROSCOPE STM Read more
SCANNING TUNNELING MICROSCOPE (STM)The Scanning Tunneling Microscope allows to measure the topography of metals, the position of their atoms, and the electron characteristics in the metal.
TRANSMISSION ELECTRON MICROSCOPE TEM Read more
Transmission Electron Microscope (TEM)The Transmission Electron Microscope allows to get magnified images of very thin samples and to analyze their composition.
SCANNING ELECTRON MICROSCOPE SEM Read more
SCANNING ELECTRON MICROSCOPE (SEM)The Scanning Electron Microscope allows to get strongly magnified images of the surface of thick samples and to analyze their composition.
FLUORESCENT AND CONFOCAL Read more
Fluorescent and confocal microscopiesThe fluorescence microscope allows to detect the presence and localization of fluorescent molecules in the sample. The confocal microscope is a specific fluorescent microscope that allows obtaining 3D images of the sample with good resolution.
DARK FIELD AND PHASE CONTRAST Read more